Ruizhengwei Electronics

：	TLV3702IDGK
：	比较器
：	Texas Instruments
：	Comparator Dual
：	-
：
：	YES

：

TLV3702IDGK

：

比较器

：

Texas Instruments

：

Comparator Dual

：

YES

TYPE	DESCRIPTION
EU RoHS	COMPL
Integrated Voltage Reference:	No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No
Integrated Voltage Reference describes if device has Voltage Reference circuit or not.
Integrated OP Amp:	No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No\|No
Integrated OP Amplifier describes if device has OP Amplifier circuit or not.
Pin Count:	8\|8\|8\|8\|8\|8\|8\|8\|8\|8\|8\|8\|8\|8\|8\|8\|8\|8\|8\|8\|8\|8\|8\|8\|8\|8\|8\|8\|8\|8\|8\|8\|8\|8\|8\|8\|8\|8\|8\|8\|8\|8\|8\|8\|8\|8\|8\|8\|8\|8
Pin Count describes number of leads attached to package body or number of contact points for each component.
Maximum Test Temperature:	125\|125\|125\|125\|125\|125\|125\|125\|125\|125\|125\|125\|125\|125\|125\|125\|125\|125\|125\|125\|125\|125\|125\|125\|125\|125\|125\|125\|125\|125\|125\|125\|125\|125\|125\|125\|125\|125\|125\|125\|125\|125\|125\|125\|125\|125\|125\|125\|125\|125
Maximum Test Temperature describes the maximum temperature at which tests can be performed on the device.
Minimum Test Temperature:	-40\|-40\|-40\|-40\|-40\|-40\|-40\|-40\|-40\|-40\|-40\|-40\|-40\|-40\|-40\|-40\|-40\|-40\|-40\|-40\|-40\|-40\|-40\|-40\|-40\|-40\|-40\|-40\|-40\|-40\|-40\|-40\|-40\|-40\|-40\|-40\|-40\|-40\|-40\|-40\|-40\|-40\|-40\|-40\|-40\|-40\|-40\|-40\|-40\|-40
Minimum Test Temperature describes the minimum temperature at which tests can be performed on the device.

TYPE

DESCRIPTION

EU RoHS

COMPL

Integrated Voltage Reference:

No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No

Integrated Voltage Reference describes if device has Voltage Reference circuit or not.

Integrated OP Amp:

No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No|No

Integrated OP Amplifier describes if device has OP Amplifier circuit or not.

Pin Count:

8|8|8|8|8|8|8|8|8|8|8|8|8|8|8|8|8|8|8|8|8|8|8|8|8|8|8|8|8|8|8|8|8|8|8|8|8|8|8|8|8|8|8|8|8|8|8|8|8|8

Pin Count describes number of leads attached to package body or number of contact points for each component.

Maximum Test Temperature:

125|125|125|125|125|125|125|125|125|125|125|125|125|125|125|125|125|125|125|125|125|125|125|125|125|125|125|125|125|125|125|125|125|125|125|125|125|125|125|125|125|125|125|125|125|125|125|125|125|125

Maximum Test Temperature describes the maximum temperature at which tests can be performed on the device.

Minimum Test Temperature:

-40|-40|-40|-40|-40|-40|-40|-40|-40|-40|-40|-40|-40|-40|-40|-40|-40|-40|-40|-40|-40|-40|-40|-40|-40|-40|-40|-40|-40|-40|-40|-40|-40|-40|-40|-40|-40|-40|-40|-40|-40|-40|-40|-40|-40|-40|-40|-40|-40|-40

Minimum Test Temperature describes the minimum temperature at which tests can be performed on the device.


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